Study on the Evolution of Surface Morphology of Hetero-Epitaxy Growth of ZnO Thin Film
Nano-granular ZnO thin films were deposited on Si (100) by molecular beam epitaxy (MBE) by varying growth time. The atomic force microscopy (AFM) and Raman scattering experiments were performed to study the surface morphology and vibrational properties of ZnO layer. The results show that the ZnO thin film grows in the Stranski-Kranstanow (SK) mode, and the critical thickness in our experimental condition is between 5.5 and 8.2 nm.
Yuan Ming Huang
J. Z. Xiao et al., "Study on the Evolution of Surface Morphology of Hetero-Epitaxy Growth of ZnO Thin Film", Materials Science Forum, Vols. 663-665, pp. 1205-1208, 2011