Study on the Evolution of Surface Morphology of Hetero-Epitaxy Growth of ZnO Thin Film

Abstract:

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Nano-granular ZnO thin films were deposited on Si (100) by molecular beam epitaxy (MBE) by varying growth time. The atomic force microscopy (AFM) and Raman scattering experiments were performed to study the surface morphology and vibrational properties of ZnO layer. The results show that the ZnO thin film grows in the Stranski-Kranstanow (SK) mode, and the critical thickness in our experimental condition is between 5.5 and 8.2 nm.

Info:

Periodical:

Materials Science Forum (Volumes 663-665)

Edited by:

Yuan Ming Huang

Pages:

1205-1208

DOI:

10.4028/www.scientific.net/MSF.663-665.1205

Citation:

J. Z. Xiao et al., "Study on the Evolution of Surface Morphology of Hetero-Epitaxy Growth of ZnO Thin Film", Materials Science Forum, Vols. 663-665, pp. 1205-1208, 2011

Online since:

November 2010

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$35.00

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