Application of High Temperature Quantitative X-Ray Powder Diffraction on Determination of Ternary System

Abstract:

This paper has put forward a high-temperature quantitative X-ray powder diffraction analysis method for the determination of an isothermal section of a ternary system in comparison with a conventional method. In a three-phase region of the isothermal section at 1150 °C of Cu₂O(CuO)-Al₂O₃-SiO₂ pseudo-ternary system, the compositions of the solid phase points of three system points are determined according to the quantitative analysis of the crystalline phases in the samples carried out by Rietveld method. Then the liquid phase point of the three-phase region is determined according to the crosspoints of the tie lines of every pair of system point and solid phase point. The precisions of the analytical results have reached to be 0.1 ~ 5.0 %. By comparison, a good result is obtained for the determination of the liquid phase point of the three-phase region in the isothermal section at 1150 °C when the analytical results of high-temperature RQA analysis are used in determination of the isothermal section of the pseudo-ternary system.

• Periodical: Materials Science Forum (Volume 689)
• Pages: 355-360
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.689.355
• Online since: June 2011
• Authors: Qiu Guo Xiao, Gang Cheng Ding, Tang Zhong Long, Shao Hua Shen
• Keywords: High Temperature X-Ray Diffraction, Isothermal Section, Quantitative Analysis, Rietveld Method

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