Precursors Influence on CaCu₃Ti₄O₁₂ Synthesis

Abstract:

In this work CCTO have been synthesized in two different chemical precursors: calcium hydroxide and copper sulfate were used to compose CCTO-S powder while calcium carbonate and copper nitrate were used to form CCTO-N powder. Calcinations conditions were dramatically different in terms of shelf time and temperature. The CCTO phase was fully obtained for 3 hours of calcination in CCTO-N against the 24 hours to form the same phase in CCTO-S powder. Ceramic bodies densities values for CCTO-S samples were 95% of theoretical density (5.05 g/cm³) and 98% for CCTO-N. The dielectric constant, at room temperature, was obtained for ceramics processed by two routes. Microstructural analysis was conducted by Scanning Electron Microscopy (SEM) and it was performed to explain the dielectric constant differences between CCTO-S and CCTO-N ceramics.

• Periodical: Materials Science Forum (Volumes 727-728)
• Pages: 1313-1316
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.727-728.1313
• Online since: August 2012
• Authors: Maria Virginia Gelfuso, Gabriel Moreira Lima, Daniel Thomazini
• Keywords: CCTO, Microwave, Raw Materials

References

[1] M.A. Subramanian., D. Li, N. Duan, B.A. Reisner, A.W. Sleight: J. Solid State Chem. Vol. 151 (2000), p.323.

[2] A.P. Ramirez, M.A. Subramanian, M. Gardel, G. Blumberg, D. Li, T. Vogt, S.M. Shapiro: Solid State Commun. Vol. 115 (2000), p.217.

DOI: 10.1016/s0038-1098(00)00182-4

[3] C.C. Homes, T. Vogt, S.M. Shapiro, S. Wakimoto, A.P. Ramirez: Science Vol. 293 (2001), p.673.

[4] M.A. Subramanian, A.W. Sleight: Solid State Sciences, Vol. 4 (2002), p.347.

[5] T.B. Adams, D. C. Sinclair and A. R. West: Phys. Rev. B, Vol. 73 (2006), p.094124.

[6] G. Chiodelli, , V. Massarotti, , D. Capsoni, , M. Bini, , C. B. Azzoni, , M. C. Mozzati: Solid State Commun. Vol. 132 (2004), p.241.

DOI: 10.1016/j.ssc.2004.07.058

[7] S. Guillemet-Fritsch, T. Lebey, M. Boulos B. Durand: J. Eur. Ceram. Soc. Vol. 26 (2006), p.1245.

[8] M.A. Ramírez, P.R. Bueno, E. Longo, J.A. Varela: J. Phys. D: Appl. Phys. Vol. 41 (2008), p.152004.

[9] L.A. Ramajo, M.A. Ramíres, P.R. Bueno, M.M. Reboredo, M.S. Castro: Materials Research Vol. 11 (2008), p.85.

[10] T. Li, Z. Chen, Y. Su, L. Su, J. Zhang: J Mater Sci., Vol. 44 (2009), p.6149.

[11] L.V. Azároff, Elements of X-Ray Crystalligraphy. McGraw-Hill: New York, (1968).

[12] F.L. Almeida, P.B. Fechine, M.P.F. Graça, M. Valente, S.B. Sombra: J. of Materials Science: Materials in Electronics Vol. 20 (2008), p.163.

[13] J.J. Romero, P. Leret, F. Rubio-Marcos, A. Quesada, J.F. Fernández. Journal of the European Ceramic Society Vol. 30 (2010), p.737.

DOI: 10.1016/j.jeurceramsoc.2009.08.024

[14] P. Leret, J.F. Fernandez, J. de Frutos, D. Fernandez-Hevia: J. of the Eur. Ceram. Soc. Vol. 27 (2007), p.3901.

[15] Xie Z, Yang J, Huang X, Huang Y. Journal of the European Ceramic Society Vol. 19 (1999), p.381.

[16] D.E. Clark, D.C. Folz, J.K. West: Mater. Sci. Eng. A, Vol. 287 (2000), p.153.

[17] S. Hutagalung, M. Ibrahim, Z. Ahmad: Ceramics International Vol. 34 (2008), p.939.