Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

Peter Staron; Torben Fischer; Jozef Keckes; Sonja Schratter; Thomas Hatzenbichler; Norbert Schell; Martin Müller; Andreas Schreyer

doi:10.4028/www.scientific.net/MSF.768-769.72

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HomeMaterials Science ForumMaterials Science Forum Vols. 768-769Depth-Resolved Residual Stress Analysis with...

Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

Abstract:

A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.

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Materials Science Forum (Volumes 768-769)

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72-75

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.768-769.72

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Online since:

September 2013

Authors:

Peter Staron, Torben Fischer, Jozef Keckes, Sonja Schratter, Thomas Hatzenbichler, Norbert Schell, Martin Müller, Andreas Schreyer

Keywords:

Conical Slits, Diffraction, High-Energy X-Rays, Residual Stress

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