Preparation and Characterization of Electrodeposited CuxBi2Te3 Thermoelectric Films

Article Preview

Abstract:

CuxBi2Te3 films were prepared by chronopotentiometry electro-deposition on indium tin oxide (ITO)-coated glass substrates from an aqueous acidic electrolyte at room temperature. The films were deposited at the same current density but in electrolyte with different Cu2+ concentrations: 0.1, 0.25, 0.5, 0.75 or 1mM. The phase composition and morphology of the films were characterized by X-ray diffraction, X-ray photoelectron spectroscopy, and field emission scanning electron microscope, respectively. The electrical conductivity and Seebeck coefficient of the CuxBi2Te3 films were measured after being transferred onto a non-conductive rubberized fabric support. All the films showed n-type conduction with Seebeck coefficient in the range of-63 to-84μV/K, and the electrical conductivity in the range of 90 to 185S/cm. The film deposited from an electrolyte with 0.5mM Cu2+ showed higher power factor ~130 μW/K-2m-1.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

205-209

Citation:

Online since:

April 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] L. D. Hicks, M. S. Dresselhaus. Phys Rev B. 47(1993)12727

Google Scholar

[2] L. D. Hicks, T. C. Harman, M. S. Dresselhaus. Appl Phys Lett. 63(1993)3230

Google Scholar

[3] R. Venkatasubramanian, E. Siivola, T. Colpitts, B. O'Quinn. Nature. 413 (2001)597

Google Scholar

[4] N. Peranio, O. Eibl, J. Nurnus. J. Appl. Phys. 100 (2006)114306.1–114306.10

Google Scholar

[5] A. Giani, A. Boulouz, B. Aboulfarah, F. Pascal-Delannoy, A. Foucaran, A. Boyer, A.Mzerd. J. Cryst. Growth. 204 (1999) 91

DOI: 10.1023/a:1006664008838

Google Scholar

[6] B. Aboulfarah, A. Giani, A. Boyer, A. Mzerd, Ann. Chim. Sci. Matér. 25 (2000) 263

Google Scholar

[7] R. S. Makala, K. Jagannadham, B.C. Sales. J. Appl. Phys. 94 (2003) 3907

Google Scholar

[8] D. Bourgault, C. G. Garampon, N. Caillault, L. Carbone, J.A. Aymami. Thin Solid Films 516 (2008) 8579– 8583

DOI: 10.1016/j.tsf.2008.06.001

Google Scholar

[9] W. Glatz, L. Durrer, E. Schwyter, C. Hierold. Electrochimica Acta 54 (2008) 755–762

DOI: 10.1016/j.electacta.2008.06.065

Google Scholar

[10] B.Y. Yoo, C.K. Huangb, J.R. Limb, J. Hermanb, M.A. Ryanb, J.P. Fleurial, N.V. Myung. Electrochim Acta 50(2005) 4371

Google Scholar

[11] P. Magri, C. Boulanger, and J.M. Lecuire. J. Mater. Chem. 6(1996)773

Google Scholar

[12] Y. Miyazaki and T. Kajitani. J. Cryst. Growth. 229 (2001)542

Google Scholar

[13] S. Michel, S. Diliberto, C. Boulanger, N. Stein, and J.M. Lecuire. J. Cryst. Growth. 277(2005)274

Google Scholar

[14] W. Wang, L.X. Bu, Chinese J. Inorganic Chem.22, 2(2006),228-232

Google Scholar

[15] K. Wang, Y.W. Liu, W.Y. Wang, N. Meyer, L. H. Bao et al. Appl. Phys. Lett. 103, 031605 (2013)

Google Scholar

[16] M.M. Rashid, K. Ho Cho, G.S. Chung. Applied Surface Science 279 (2013) 23-30

Google Scholar

[17] X. Wang, H.C. He, N. Wang, L. Miao. Applied Surface Science 276 (2013) 539-542

Google Scholar

[18] M.K. Han, K. Ahn, H.J. Kim, J.S. Rhyeeand, S.J. Kim. J. Mater. Chem. 21(2011), 11365–11370

Google Scholar

[19] J. Bludska, S. Karamazov, J. Navratil, I. Jakubec, J. Horak. Solid State Ionics 171 (2004) 251-259

Google Scholar

[20] D.W. Liu, J.F. Li. J. Electrochem. Soc. 155 (2008) 493-498

Google Scholar

[21] Z.G. Zou, K.F. Cai, S. Chen, Z. Qin. Materials Research Bulletin 47 (2012) 3292-3295

Google Scholar

[22] K.S. Novoselov, A. K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V. Grigorieva, A.A. Firsov, Science. 306 (2004)666-669

DOI: 10.1126/science.1102896

Google Scholar

[23] W. McClune, Powder Diffraction File, JCPDS International Center for Diffraction Data, Swarthmore, PA, (1988)

Google Scholar

[24] H.J. Song, C.C. Liu, H.F. Zhu, F.F. Kong, B.Y. Lu, J.K. Xu, J.M. Wang, and F. Zhao. Electronic Materials 42 (2013) 1268-1274

Google Scholar

[25] Z.G. Zeng, P.H. Yang, Z.Y. Hu. Applied Surface Science 268 (2013) 472-476

Google Scholar