Depth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron Radiation

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Periodical:

Materials Science Forum (Volumes 79-82)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

469-474

Citation:

T. Wroblewski "Depth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron Radiation", Materials Science Forum, Vols. 79-82, pp. 469-474, 1991

Online since:

January 1991

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$38.00

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