Characterization of Epitaxial Thin Films by X-Ray Diffraction

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Periodical:

Materials Science Forum (Volumes 79-82)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

493-502

DOI:

10.4028/www.scientific.net/MSF.79-82.493

Citation:

A. Segmüller "Characterization of Epitaxial Thin Films by X-Ray Diffraction", Materials Science Forum, Vols. 79-82, pp. 493-502, 1991

Online since:

January 1991

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$35.00

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