The Use of Debye Scherrer Geometry for High Resolution Powder Diffraction
p.455
p.455
A New Beauty for Adone: A High Resolution Powder Diffractometer for Synchrotron Radiation Experiments
p.463
p.463
Depth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron Radiation
p.469
p.469
A New High Resolution Neutron Powder Diffractometer at the Brookhaven High Flux Beam Reactor
p.475
p.475
A New Neutron-Multi-Detector Diffractometer at the Rossendorf-Reactor
p.481
p.481
Status and Horizons of Time-Resolved Neutron Scattering at the Pulsed Reactor IBR-2
p.487
p.487
Characterization of Epitaxial Thin Films by X-Ray Diffraction
p.493
p.493
Glory and Misery of the Structure Analysis of Thin Polycrystalline Films
p.503
p.503
Applied Crystallography in Advanced Ceramics
p.513
p.513
A New Neutron-Multi-Detector Diffractometer at the Rossendorf-Reactor
Abstract:
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Periodical:
Materials Science Forum (Volumes 79-82)
Pages:
481-486
Citation:
Online since:
January 1991
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Сopyright:
© 1991 Trans Tech Publications Ltd. All Rights Reserved
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