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X-Ray Determination of Characteristics of Finely Dispersed Supports and Supported Catalysts
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Indexing of New Superconducting Oxide Powder Patterns
p.919

Stoichiometry and Temperature Dependence of YBa₂Cu₃O_x Structure Parameters
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Temperature Dependence of the Lattice Constants of YBa₂Cu₃O_7-x
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Growth of YBa₂Cu₃O_7-x Thin Films on R-Plane Sapphire (O112) Using Yttria Stabilized Zirconia (YSZ) Buffer Layers
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X-Ray Absorption and Reflection in Materials Science
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Some Sample Preparation Methods for Powder Diffraction at Neste Oy
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Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods
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Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-T_c Superconductors
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HomeMaterials Science ForumMaterials Science Forum Vols. 79-82X-Ray Absorption and Reflection in Materials...

X-Ray Absorption and Reflection in Materials Science

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Periodical:

Materials Science Forum (Volumes 79-82)

Pages:

947-958

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82.947

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Online since:

January 1991

Authors:

B. Lengeler

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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