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Some Sample Preparation Methods for Powder Diffraction at Neste Oy
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HomeMaterials Science ForumMaterials Science Forum Vols. 79-82Transmission Electron Microscopy: An Important...

Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-T_c Superconductors

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Periodical:

Materials Science Forum (Volumes 79-82)

Pages:

971-0

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82.971

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Online since:

January 1991

Authors:

O. Eibl, H. Budin, P. Pongratz, P. Skalicky

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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