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HomeMaterials Science ForumMaterials Science Forum Vols. 79-82Characterization of Gels and Thin Gel Films by...

Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods

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Periodical:

Materials Science Forum (Volumes 79-82)

Pages:

965-970

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82.965

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Online since:

January 1991

Authors:

Th. Gerber, B. Himmel, U. Buttler, H. Bürger, U. Bräutigam

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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