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Materials Science Forum Vols. 79-82

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82

ToC:

Table of Contents

Paper Title Page

Transmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-Tc Superconductors
Authors: O. Eibl, H. Budin, P. Pongratz, P. Skalicky
971

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