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Materials Science Forum Vols. 79-82

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82

ToC:

Table of Contents

Paper Title Page

Structure of TiN Thin Film Grains in Dependence on their Crystallographic Orientation
Authors: V. Valvoda, R. Cerný, Radomír Kužel, M. Blomberg, M. Merisalo
903
Heat-Treated NiO and Changes of Microstructural Parameters
Authors: S. Pocev, B. Marina, S. Bogoevski
909
X-Ray Determination of Characteristics of Finely Dispersed Supports and Supported Catalysts
Authors: E.M. Moroz, V.A. Ushakov, S.V. Bogdanov
915
Indexing of New Superconducting Oxide Powder Patterns
Authors: J. Hauck, B. Bischof, N. Dockal, E. Droste, C. Feiburg, H. Hindriks, S. Ipta, F. Klumpe, K. Mika, A. Preikschat
919
Stoichiometry and Temperature Dependence of YBa2Cu3Ox Structure Parameters
Authors: G. Försterling, I.V. Golosovsky, W. Plakhty
927
Temperature Dependence of the Lattice Constants of YBa2Cu3O7-x
Authors: U. Wachtel, M.G. Gorskaja, S.K. Filatow, P. Paufler, W. Schmitz, W. Reichelt
935
Growth of YBa2Cu3O7-x Thin Films on R-Plane Sapphire (O112) Using Yttria Stabilized Zirconia (YSZ) Buffer Layers
Authors: K. Hradil, Harald Schmidt, W. Hösler, W. Wersing, F. Frey, B. Jobst, G. Zorn
941
X-Ray Absorption and Reflection in Materials Science
Authors: B. Lengeler
947
Some Sample Preparation Methods for Powder Diffraction at Neste Oy
Authors: H. Oesterholm, J. Vilhunen
959
Characterization of Gels and Thin Gel Films by X-Ray Diffraction Methods
Authors: Th. Gerber, B. Himmel, U. Buttler, H. Bürger, U. Bräutigam
965

Showing 141 to 150 of 151 Paper Titles

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