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HomeMaterials Science ForumMaterials Science Forum Vols. 79-82

Materials Science Forum Vols. 79-82

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82

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Table of Contents

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Paper Title Page

Sign Determination from Powder Diffraction Data of CuSo₄ · 5H₂O

Authors: W. Limper, W. Prandl, Thomas Wroblewski

221

Fourier Maps Obtained from Powder Diffraction Data - Applications Beyond Pure Illustration

Authors: S. Jantsch, J. Ihringer, W. Prandl, H. Ritter

227

Influence of Crystallite Size and Microstain on Structure Refinement

Authors: Paolo Scardi, Luca Lutterotti, R. Di Maggio, P. Maistrelli

233

Crystal Size Dependent Anisotropic Line Broadening in Rietveld X-Ray Analysis

Authors: R. Millini, G. Perego, S. Brückner

239

A Theta-Dependent Error Present in Powder Data of Highly Absorbing Materials: A Surface Roughness Effect?

Authors: N. Masciocchi, H. Toraya, W. Parrish

245

Qualitative XRPD Analysis System

Authors: V. Pivoriunas

251

Qualitative X-Ray Phase Analysis on the Basis of the Calculated Standards

Authors: A.V. Chichagov

257

Program Package COMPHYS for IBM PC

Authors: M.S. Nakhmanson

263

Solution of Nontraditional Problems Based upon PDF-2

Authors: M.S. Nakhmanson

267

Database for Qualitative X-Ray Diffraction Phase Analysis of Natural Materials

Authors: E.K. Vasil'ev

271

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