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Materials Science Forum Vols. 79-82

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.79-82

ToC:

Table of Contents

Paper Title Page

X-Ray Stress Analysis
Authors: Jean Michel Sprauel, L. Castex
143
Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis
Authors: S. Fischer, E. Houtman, H.R. Maier
153
Non-Destructive Stress Measurement with Depth Resolution
Authors: M. Härting, G. Fritsch
159
Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
Authors: H.-G. Brühl, H. Rhan
165
Preferred Orientation in Powder Diffraction
Authors: Hans Joachim Bunge
169
Texture Analysis of Multi-Phase Materials by Neutron Diffraction
Authors: Heinz Günter Brokmeier
179
Extinction in Texture Analysis
Authors: A. Mücklich, P. Klimanek
185
Method of Scanning of Reciprocal Space of Axial Textures and its Applications to Structural Investigations
Authors: G.A. Krinari, Z.J. Halitov
191
On the Use of Rietveld Refinements for Structural Studies
Authors: P.-E. Werner
197
The Two-Step-Method and its Applications in Crystallographic Problems
Authors: Georg Will
207

Showing 21 to 30 of 151 Paper Titles

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