EBSD Sample Preparation: High Energy Ar Ion Milling

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Abstract:

Surface quality development on series of metal samples was investigated using a new Ar ion milling apparatus. The surface quality of samples was characterized by the image quality (IQ) parameter of the electron backscatter diffraction (EBSD) measurement. Ar ion polishing recipes have provided to prepare a surface appropriate for high quality EBSD mapping. The initial surfaces of samples were roughly grinded and polished. High quality surface smoothness could be achieved during the subsequent Ar ion polishing treatment. The optimal angles of Ar ion incidence and the polishing times were determined for several materials.

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309-314

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February 2015

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© 2015 Trans Tech Publications Ltd. All Rights Reserved

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[1] G. Beilby, Aggregation and Flow of Solids, Macmillan, London, (1921).

Google Scholar

[2] Information on http: /www. technoorg. hu/uploads/semprep. pdf.

Google Scholar

[3] Information on http: /sem. elte. hu.

Google Scholar

[4] T. Berecz, Sz. Kalácska, G. Varga, Z. Dankházi, K. Havancsák, Effect of high energy Ar-ion milling on surface of quenched low carbon low-alloyed steel, published in this issue.

DOI: 10.4028/www.scientific.net/msf.812.285

Google Scholar

[5] J. Goldstein, D. Newbury, D. Joy, Ch. Lyman, P. Echlin, E. Lifshin, L. Sawer and J. Michael, Scanning Electron Microscopy and X-Ray Microanalysis, Springer (2007), ISBN: 978-0-306-47292-3.

DOI: 10.1017/s1431927603030617

Google Scholar