Innovative Residual Stress Measurements by X-Ray Diffraction

Dávid Cseh; Valéria Mertinger; Márton Benke

doi:10.4028/www.scientific.net/MSF.812.303

Paper Titles

In Situ Optical Microscopic Examination Techniques of Thermally Induced Displacive Transformations
p.279

Effect of High Energy Ar-Ion Milling on Surface of Quenched Low-Carbon Low-Alloyed Steel
p.285

Examination of Thermodynamic Realignments of Metals and Metal-Alloys, by DMTA Technique
p.291

A Method for the Determination of Ferrite Grains with a Surface Normal close to the (111) Orientation in Cold Rolled Steel Samples with Color Etching and Optical Microscopy
p.297

Innovative Residual Stress Measurements by X-Ray Diffraction
p.303

EBSD Sample Preparation: High Energy Ar Ion Milling
p.309

Cold Rolling Effect on Microstructure and Mechanical Properties of Low Carbon Al-Killed Steels
p.315

Residual Stress in Plain Carbon Steel Induced by Laser Hardening
p.321

Comparative Corrosion Study on Silver Coated Metallic Implants
p.327

HomeMaterials Science ForumMaterials Science Forum Vol. 812Innovative Residual Stress Measurements by X-Ray...

Innovative Residual Stress Measurements by X-Ray Diffraction

Abstract:

An innovative X-ray diffractometer especially designed for residual stress measurements was deployed at the Institute of Physical Metallurgy, Metalforming and Nanotechnology of the University of Miskolc. The advantages of the equipment over the traditional X-ray diffraction stress measuring methods are presented through our experiences on industrial components with varying sizes, geometries and measurement requirements. The microstructural limitations of the X-ray diffraction based residual stress measurement method are also discussed.

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Periodical:

Materials Science Forum (Volume 812)

Pages:

303-308

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.812.303

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Online since:

February 2015

Authors:

Dávid Cseh, Valéria Mertinger, Márton Benke

Keywords:

Non-Destructive Measurements, Residual Stress, sin²ψ Method, Stress Tensor, X-Ray Diffraction

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