Quantified X-Ray Mapping in the WDS Mode

Article Preview

Abstract:

In material science, there is an increased demand for mapping of microstructural components and their composition. EPMA (Electron Probe Micro Analysis) with WDS (Wavelength Dispersive Spectrometry) is known as having high spectral resolution and sensitivity, but in practice considered to be slow in mapping applications. The present work describes a development of EPMA including design of both instrumental hardware and software related to electronics and calibration.

You have full access to the following eBook

Info:

Periodical:

Pages:

520-523

Citation:

Online since:

June 2018

Keywords:

Export:

Share:

Citation:

* - Corresponding Author

[1] J. Goldstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, Springer (2003).

DOI: 10.1007/978-1-4615-0215-9

Google Scholar

[2] K. Grönlund, G. Runnsjö, An electron micro/macro probe system for elemental concentration mapping. CETAS Conference on Progress of Analytical Chemistry, Luxembourg (2002).

Google Scholar

[3] S. Vahzehrad, A study on factors influencing the microstructure and shrinkage porosity formation in compacted graphite iron, Licentiate Thesis, KTH Royal Institute of Technology, Stockholm, Sweden (2014).

Google Scholar