Application of Rietveld Refinement and Williamson Hall Analysis in Ultra-Low Carbon to High Carbon Steels

Abstract:

Current study deals with the microstructural characterization of five different plates of steel with carbon concentration ranging from ultra-low to moderately high. Phase analysis was carried out using XRD technique. The XRD results were analyzed through Rietveld refinement and Williamson Hall plots. Rietveld refinement was carried out to understand the effect of carbon concentration on the lattice parameters of the above steel samples in as-received condition and also after deformation under uni-axial tensile loading. Lattice parameters obtained from refinement showed the strong dependence on carbon concentration of the given steels. But the failed specimens showed somewhat complex results as Spheroidized high carbon steel, Low carbon steel and IF steel showed an increase in lattice parameter whereas Medium carbon steel and Microalloyed steel showed a contraction in lattice parameter. Williamson Hall plot gave the crystallite size, microstrain and dislocation density in the steels. For IF and Microalloyed steels the dislocation density in the material is found to be higher after deformation whereas dislocation density decreased in Spheroidized high carbon steel, Medium carbon steel and Low carbon steel.

• Periodical: Materials Science Forum (Volume 969)
• Pages: 3-8
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.969.3
• Online since: August 2019
• Authors: Soumya Sourav Sarangi, Avala Lavakumar*
• Keywords: IF Steel, Micro-Alloyed Steel, Rietveld Refinement, Steels, Williamson Hall Analysis

References

[1] S. Takebayashi, T. Kunieda, N. Yoshinaga, K. Ushioda, S.Ogata, Comparison of the dislocation density in martensitic steels evaluated by some X-ray diffraction methods, ISIJ international 50 (2010) 875-882.

DOI: 10.2355/isijinternational.50.875

[2] Y. I. Kim, F. Izumi, Structure Refinements with a new version of the Rietveld-Refinement program RIETAN, Journal of the Ceramic Society of Japan 102 (1994) 401-404.

DOI: 10.2109/jcersj.102.401

[3] R. J. Hill, R. X. Fischer, Profile agreement indices in Rietveld and pattern-fitting analysis, Journal of Applied Crystallography 23 (1990) 462-468.

DOI: 10.1107/s0021889890006094

[4] L. Lutterotti, R. Ceccato, R. Dal Maschio, E. Pagani, Quantitative analysis of silicate glass in ceramic materials by the Rietveld method, Materials Science Forum 278 (1984) 87-92.

DOI: 10.4028/www.scientific.net/msf.278-281.87

[5] F. Izumi, Beyond the ability of Rietveld analysis: MEM-based pattern fitting, Solid State Ionics, 172 (2004) 1-6.

DOI: 10.1016/j.ssi.2004.04.023

[6] R. A. Young, The rietveld method. International union of crystallography, (1993).