Influence of Annealing on the Electrophysical Properties of Copper Oxide (II) Thin Film, Prepared by Sol-Gel Method

Abstract:

This article discusses the effect of annealing time at temperatures of 400 and 500 ° C on the electrophysical properties of CuO films prepared by the sol-gel method based on isopropyl alcohol, copper acetate and diethylamine. The film thickness was 440 nm. Phase composition, electrical resistance, conductivity type, optical properties of films are determined.

• Periodical: Nano Hybrids and Composites (Volume 28)
• Pages: 48-52
• DOI: https://doi.org/10.4028/www.scientific.net/NHC.28.48
• Online since: February 2020
• Authors: Dmitriy Sergeevich Permyakov*, Stanislav Ivanovich Rembeza, Tatiana Gennadevna Menshikova, Vladimir Evgenevich Polkovnikov, Maksim Aleksandrovich Belykh
• Keywords: Copper Oxide (II), Electrophysical Properties, Sol-Gel, Spin Coating, X-Ray Diffraction

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