Microstructure and Texture of Shear Bands in Cold Rolled Silicon Steel Single Crystals of Goss Orientation

Abstract:

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An initially Goss-oriented ({110}<001> preferred crystal orientation) FeSi single crystal was cold rolled up to 89 % reduction in thickness. The microstructure and texture of shear bands, which develop at strains higher than 70 %, were investigated by the EBSD (electron backscatter diffraction) technique. The texture components within and ouside of the shear bands are the two symmetrical {111}<112> orientations and the {110}<001> orientation. We conclude that crystallographic slip is the deformation mechanism that is active both within and outside of the shear bands.

Info:

Periodical:

Solid State Phenomena (Volume 105)

Edited by:

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner

Pages:

239-244

DOI:

10.4028/www.scientific.net/SSP.105.239

Citation:

D. Dorner and S. Zaefferer, "Microstructure and Texture of Shear Bands in Cold Rolled Silicon Steel Single Crystals of Goss Orientation ", Solid State Phenomena, Vol. 105, pp. 239-244, 2005

Online since:

July 2005

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$35.00

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