Microstructure and Texture of Shear Bands in Cold Rolled Silicon Steel Single Crystals of Goss Orientation

Dorothée Dorner; Stefan Zaefferer

doi:10.4028/www.scientific.net/SSP.105.239

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Microstructure and Texture of Shear Bands in Cold Rolled Silicon Steel Single Crystals of Goss Orientation

Abstract:

An initially Goss-oriented ({110}<001> preferred crystal orientation) FeSi single crystal was cold rolled up to 89 % reduction in thickness. The microstructure and texture of shear bands, which develop at strains higher than 70 %, were investigated by the EBSD (electron backscatter diffraction) technique. The texture components within and ouside of the shear bands are the two symmetrical {111}<112> orientations and the {110}<001> orientation. We conclude that crystallographic slip is the deformation mechanism that is active both within and outside of the shear bands.

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Periodical:

Solid State Phenomena (Volume 105)

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239-244

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.105.239

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Online since:

July 2005

Authors:

Dorothée Dorner, Stefan Zaefferer

Keywords:

Goss Orientation, Shear Band, Silicon Steel, Single Crystal Deformation

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