Dynamic Mode of Line Scale Calibration

Abstract:

• Periodical: Solid State Phenomena (Volume 113)
• Pages: 447-452
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.113.447
• Online since: June 2006
• Authors: Saulius Kaušinis, Aurimas Jakštas, Rimantas Barauskas, Albinas Kasparaitis
• Keywords: Dynamic Modelling, Interferential Comparator, Line Scale Calibration

References

[1] H. Bosse, J. Flügge: Requirements and recent developments in high precision length metrology (Proceedings of the 159, PTB-Seminar 2001)

[2] WGDM-7: Preliminary comparison on nanometrology according to the rules of CCL key comparisons NANO 3 (Line Scale Standards, Final Report, Braunschweig, 29August 2003), p.119

[3] A. Lassila, E. Ikonen and K. Riski: Interferometer for calibration of graduated line scales with a moving CCD camera as a line detector (Applied Optics No16, Vol. 33, 1994), pp.3600-3603.

DOI: 10.1364/ao.33.003600

[4] A. Lassila: Updated performance and uncertainty budget of MIKES' line scale interferometer (Proc. of 4th Euspen International Conference- Glasgow, Scotland (UK), May-June 2004).

[5] R. Barauskas: Techniques in the Dynamic Analysis of Structures with Unilateral Constraints (Structural Dynamic Systems Computational Techniques and Optimization: Nonlinear Techniques, Gordon and Breach Science Publishers, 1999), pp.131-194

[6] J. Flügge, H. J. Schuster: A high precision temperature measurement system with Pt 100 for precision Engineering (PTB Bericht F-17: Temperature Measurements in Dimensional Metrology, 1993), pp.8-16

[7] A. Jakštas, S. Kaušinis and J. Flügge: Investigation of calibration facilities of precision line scales (Mechanika, No 3 (53), Technologija, Kaunas, 2005), pp.62-67