Paper Titles

Model for Time-Dependent Stress and Strain Analysis of Layered Composite Element
p.571

Operation Reliability of Bent Elbows of Steam Pipelines
p.577

Influence of Ultraviolet Radiation on Erosive Resistance of Modified Epoxy Coatings
p.583

Liquid Phase Deposition of TiO₂ Films on Different Substrate
p.589

New Challenges for Education Nanotechnology
p.595

Mechatronics Course Design for Industry
p.599

The Mechatronics Design for Measuring Fluid Friction Losses in Pipe Flows
p.603

New Trends in Biomechatronic Engineering Education
p.609

Improvement and Evaluation of the Study Process in Mechatronic Systems
p.615

HomeSolid State PhenomenaSolid State Phenomena Vol. 113New Challenges for Education Nanotechnology

New Challenges for Education Nanotechnology

Article Preview

Abstract:

You might also be interested in these eBooks

Mechatronic Systems and Materials

Info:

Periodical:

Solid State Phenomena (Volume 113)

Pages:

595-598

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.113.595

Citation:

Cite this paper

Online since:

June 2006

Authors:

R. Navickas

Keywords:

Education, Micro-Electromechanical System (MEMS), Multidisciplinarity, Nanoelectromechanical Systems (NEMS), Nanoelectronics, Nanotechnology

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] F. Grey: Proc. of the 4 th Joint NSF-EC Workshop on Nanotechnology CEA, Grenoble, 12-13 June (2002), p.56

[2] V. Bayot: Proc. of the EURONANOFORUM 2003 European and International Forum on Nanotechnology CEA, Trieste on 9-12 December (2003), pp.41-43

[3] B. Doris et al.: Tech. Digest IEDM (2002), pp.267-270

[4] A. De Baas and H. Péro: Proc. of the 4 th Joint NSF-EC Workshop on Nanotechnology CEA, Grenoble, 12-13 June (2002), pp.104-115

[5] R. Navickas, R. Kirvaitis: Solid State Phenomena, Pt. B of Diffusion and Defect Data Scitec Publications Ltd., Switzerland, Vols. 97-98, (2004), pp.229-234

[6] Y. Nishi: Future Trends in Microelectronics (Wiley-Interscience, 2004), pp.46-56