The Atomic Force Microscopy (AFM) Charecterization of Ni(phen) 2+3 Fixing Effects on DNA Molecules

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 121-123)

Edited by:

Chunli BAI, Sishen XIE, Xing ZHU

Pages:

1359-1362

DOI:

10.4028/www.scientific.net/SSP.121-123.1359

Citation:

H. Wang et al., "The Atomic Force Microscopy (AFM) Charecterization of Ni(phen) 2+3 Fixing Effects on DNA Molecules", Solid State Phenomena, Vols. 121-123, pp. 1359-1362, 2007

Online since:

March 2007

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.