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HomeSolid State PhenomenaSolid State Phenomena Vols. 121-123AF/PSTM and Its Application in Nanometer Material...

AF/PSTM and Its Application in Nanometer Material Measurement

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Nanoscience and Technology

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Periodical:

Solid State Phenomena (Volumes 121-123)

Pages:

859-862

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.121-123.859

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Online since:

March 2007

Authors:

Yin Li Li, Jian Zhang, Shi Fa Wu, Peng Fei Li, Shi Pan

Keywords:

Nanometer Material Measurment, Nanotechnology, SNOM

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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