AF/PSTM and Its Application in Nanometer Material Measurement

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Periodical:

Solid State Phenomena (Volumes 121-123)

Edited by:

Chunli BAI, Sishen XIE, Xing ZHU

Pages:

859-862

DOI:

10.4028/www.scientific.net/SSP.121-123.859

Citation:

Y. L. Li et al., "AF/PSTM and Its Application in Nanometer Material Measurement", Solid State Phenomena, Vols. 121-123, pp. 859-862, 2007

Online since:

March 2007

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Price:

$35.00

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