Effects of Pretreatment on the Etch Pit Formation during the Electrochemical Etching of Aluminum

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Abstract:

The effect of chemical pretreatments on the electrochemical etching behavior of aluminum was investigated with the topographic studies of surface and the analysis of initial potential transients. Two-step pretreatments with H3PO4 and H2SiF6 result in a high density of pre-etch pits on aluminum surface by the incorporation of phosphate ion inside the oxide film and the removal of surface layer by aggressive fluorosilicic acid solution. It generates a high density of etch pits during electrochemical etching and results in the capacitance increase of etched Al electrode by expanding the surface area, up to 61.3 μF/cm2 with the pretreatment solution of 0.5M H3PO4 at 65°C and 10 mM H2SiF6 at 45°C.

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Solid State Phenomena (Volumes 124-126)

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1561-1564

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June 2007

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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