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X-Ray Analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 Compounds

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Abstract:

The polycrystalline Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 compounds were obtained using ceramic method. X-ray analysis was used to make phase and structure analysis. The Rietveld method was applied for structure refinement. Both compounds crystallized in cubic, normal spinel structure, Fd 3m. Besides the main spinel phase, Cr2Se3 was observed.

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Periodical:

Solid State Phenomena (Volume 130)

Pages:

93-96

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.130.93

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Online since:

December 2007

Authors:

Ewa Maciążek, Tomasz Goryczka, Izabela Jendrzejewska

Keywords:

Ceramic Method, Rietveld Refinement, Spinel, X-Ray Diffraction (XRD)

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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