X-Ray Analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 Compounds

Abstract:

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The polycrystalline Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 compounds were obtained using ceramic method. X-ray analysis was used to make phase and structure analysis. The Rietveld method was applied for structure refinement. Both compounds crystallized in cubic, normal spinel structure, Fd 3m. Besides the main spinel phase, Cr2Se3 was observed.

Info:

Periodical:

Solid State Phenomena (Volume 130)

Edited by:

Danuta Stróż & Małgorzata Karolus

Pages:

93-96

DOI:

10.4028/www.scientific.net/SSP.130.93

Citation:

E. Maciążek et al., "X-Ray Analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 Compounds", Solid State Phenomena, Vol. 130, pp. 93-96, 2007

Online since:

December 2007

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$35.00

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