[1]
F. Shimojo, I. Ebbsjö, R.K. Kalia, A. Nakano, J.P. Rino, and P. Vashishta: Molecular dynamics simulation of structural transformation in silicon carbide under pressure. Phys. Rev. Lett. Vol. 84 (2000), pp.3338-3341.
DOI: 10.1103/physrevlett.84.3338
Google Scholar
[2]
F. Shimojo, S. Kodiyalam, I. Ebbsjö, R.K. Kalia, A. Nakano, J.P. Rino and P. Vashishta: Atomistic mechanism for wurtzite-to-rocksalt structural transformation in cadmium selenide under pressure. Phys. Rev. Vol. B70 (2004), CID 184111-1-6.
DOI: 10.1103/physrevb.70.184111
Google Scholar
[3]
H. Sowa.: A transition path from the zinc-blende to the NaCl type. Z. Kristallogr. Vol. 215 (2000), pp.335-342.
DOI: 10.1524/zkri.2000.215.6.335
Google Scholar
[4]
H. Sowa.: On the transition from the wurtzite to the NaCl type. Acta Crystallogr. Vol. A57 (2001), pp.176-182.
Google Scholar
[5]
H. Sowa: Relations between the zinc-blende and the NaCl type. Acta Crystallogr. Vol. A59 (2003), pp.266-272.
Google Scholar
[6]
H. Sowa: A transition path for the pressure induced wurtzite- to NaCl-type transformation described in Pna21. Acta Cryst. Vol. A61 (2005), pp.325-330.
DOI: 10.1107/s0108767305007233
Google Scholar
[7]
D.M. Hatch, H.T. Stokes, J. Dong, J. Gunter, H. Wang and J.P. Lewis: Bilayer sliding mechanism for the zinc-blende to rocksalt transition in SiC. Phys. Rev. Vol. B71 (2005), CID 184109-1-9.
DOI: 10.1103/physrevb.71.184109
Google Scholar
[8]
H.T. Stokes, J. Gunter, D.M. Hatch, J. Dong, H. Wang and J.P. Lewis: Bilayer sliding mechanism for the wurtzite to rocksalt transition. Phys. Rev. Vol. B76 (2007), CID 012102.
DOI: 10.1103/physrevb.76.012102
Google Scholar
[9]
C. Capillas, J.M. Perez-Mato and M.I. Aroyo: Maximal symmetry transition paths for reconstructive phase transitions. J. Phys. Condens. Matter Vol. 19 (2007), CID 275203.
DOI: 10.1088/0953-8984/19/27/275203
Google Scholar
[10]
H. Sowa: The high-pressure behaviour of CdSe up to 3 GPa and the orientation relations between its wurtzite- and NaCl-type phases. Solid State Sci. Vol. 7 (2005), pp.1384-1389.
DOI: 10.1016/j.solidstatesciences.2005.09.003
Google Scholar
[11]
H. Sowa: Orientation relations between zinc-blende-, cinnabar- and NaCl-type phases of CdTe under high pressure. J. Appl. Crystallogr. Vol. 38 (2005), pp.537-543.
DOI: 10.1107/s0021889805010356
Google Scholar
[12]
H. Sowa, H. Ahsbahs and W. Schmitz: X-ray diffraction studies of millerite NiS under non-ambient conditions. Phys. Chem. Minerals Vol. 31 (2004), pp.321-327.
DOI: 10.1007/s00269-004-0392-0
Google Scholar
[13]
G. Kullerud and R.A. Yund: The Ni-S system and related minerals. J. Petrol. Vol. 3 (1962), pp.126-175.
Google Scholar
[14]
J. Trahan, R.G. Goodrich and S.F. Watkins: X-ray diffraction measurements on metallic and semiconducting hexagonal NiS. Phys. Rev. Vol. B2 (1970), CID 2859-2862.
DOI: 10.1103/physrevb.2.2859
Google Scholar
[15]
J.C. Barry and S. Ford: An electron microscopic study of nickel sulfide inclusions in toughened glass J. Mater. Sci. Vol. 36 (2001), pp.3721-3730.
Google Scholar
[16]
H. Wang, A. Pring, Y. Ngothai and B. O'Neill: The kinetics of the α → β transition in synthetic nickel monosulfide. Am. Mineral. Vol. 91 (2006), pp.171-181.
DOI: 10.2138/am.2006.1962
Google Scholar
[17]
H. Klein, A. Preusser, L. Raue and H.J. Bunge: Measurement of high-resolution recrystallization textures in nickel sheets using high-energy synchrotron radiation. Mat. Sci. Forum Vol. 495-497 (2005), pp.137-142.
DOI: 10.4028/www.scientific.net/msf.495-497.137
Google Scholar
[18]
H.J. Bunge, L. Wcislak, H. Klein, U. Garbe and J.R. Schneider: Texture and microstructure analysis with high-energy synchrotron radiation. Adv. Engin. Mater. Vol. 4 (2002), pp.300-305.
DOI: 10.1002/1527-2648(20020503)4:5<300::aid-adem300>3.0.co;2-q
Google Scholar
[19]
L. Lutterotti, S. Matthies and H. -R. Wenk: MAUD (Material Analysis Using Diffraction): A user friendly Java program for Rietveld texture analysis and more,. In J.A. Szpunar (ed. ): Proc. 12th Intern. Conf. Textures of Materials (ICOTOM-12). NRC Research Press, Ottawa (Canada) (1999).
Google Scholar