Application of Electron Backscatter Diffraction to Grain Boundaries

Abstract:

The technique of electron backscatter diffraction (EBSD) is ideal for the characterisation of grain boundary networks in polycrystalline materials. In recent years the experimental methodology has evolved to meet the needs of the research community. For example, the capabilities of EBSD have been instrumental in driving forward the topic of ‘grain boundary engineering’. In this paper the current capabilities of EBSD for grain boundary characterisation will be reviewed and illustrated by examples. Topics are measurement strategies based on misorientation statistics, determination of grain boundary plane distributions and grain boundary network characteristics.

• Periodical: Solid State Phenomena (Volume 160)
• Pages: 39-46
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.160.39
• Online since: February 2010
• Authors: Valerie Randle
• Keywords: Electron Backscatter Diffraction (EBSD), Grain Boundary, Grain Boundary Plane

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