Electron Mobility Model of Strained Si1-xGex(001)

Abstract:

Article Preview

Solving the Schrödinger equation with strain Hamiltonian and combining with KP theory, we obtained the conductivity effective mass and density of states effective mass of strained Si1-xGex(001) in this paper. On the basis of conductivity effective mass and density of states effective mass, considered of Fermi golden rule and Boltzman collision term approximation theory, scattering rate model was established in strained Si1-xGex(001). Based on the conductivity effective mass and scattering rate models we discussed the dependence of electron mobility on stress and doping concentration in strained Si1-xGex(001), it shows that electron mobility decrease with the increasing of stress and doping concentration. This result can provide valuable references to the research of electron mobility of strained Si1-xGex materials and the design of devices.

Info:

Periodical:

Solid State Phenomena (Volumes 181-182)

Edited by:

Yuan Ming Huang

Pages:

378-382

DOI:

10.4028/www.scientific.net/SSP.181-182.378

Citation:

H. Y. Hu et al., "Electron Mobility Model of Strained Si1-xGex(001)", Solid State Phenomena, Vols. 181-182, pp. 378-382, 2012

Online since:

November 2011

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.