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HomeSolid State PhenomenaSolid State Phenomena Vols. 203-204Multi-Technique Approach for Nanoparticles...

Multi-Technique Approach for Nanoparticles Characterization on a Laboratory X-Ray Diffractometer

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Abstract:

There is an ongoing interest in nanoparticles for the unique properties that have applications in a range of fields including catalysis, semi-conductors, gas storage amongst many others. In this study a variety of distinct techniques were applied on the same in-house X-Ray diffractometer. In particular, SAXS, conventional XRD and Total Scattering of nano-sized TiO2 powders were performed, together with in-situ heating experiments. The combination of the results from each technique proves to be a powerful tool for a more complete description of the material.

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Applied Crystallography XXII

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Periodical:

Solid State Phenomena (Volumes 203-204)

Pages:

17-20

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.203-204.17

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Online since:

June 2013

Authors:

Marco Sommariva

Keywords:

In-House Diffractometer, Nanomaterial, Non-Ambient, PDF, SAXS, Total Scattering

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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