HRTEM and LACBED of Zigzag Boundaries in GaN Epilayers

Elżbieta Jezierska; Jolanta Borysiuk

doi:10.4028/www.scientific.net/SSP.203-204.24

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HomeSolid State PhenomenaSolid State Phenomena Vols. 203-204HRTEM and LACBED of Zigzag Boundaries in GaN...

HRTEM and LACBED of Zigzag Boundaries in GaN Epilayers

Abstract:

Defects recognition in GaN epilayers was performed using HRTEM and LACBED images. Edge type dislocations, basal plane and prismatic stacking faults were determined from HRTEM analysis. Stacking mismatch boundaries on zigzag steps were found and examined using LACBED patterns in bright and dark field. For stacking faults Bragg lines split into a main and a subsidiary line. The fault plane and displacement vector can be identified from trace analysis performed on LACBED patterns.

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Periodical:

Solid State Phenomena (Volumes 203-204)

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24-27

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https://doi.org/10.4028/www.scientific.net/SSP.203-204.24

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June 2013

Authors:

Elżbieta Jezierska, Jolanta Borysiuk

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GaN, HRTEM, LACBED, Zigzag Boundaries

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