Morphology and Structure of the Interface Layers in Ni/Ge Thin Films

Abstract:

Morphology and structure of the interface in Ni/Ge thin films being due to the mutual diffusion of these elements are investigated with the help of atomic force microscope, high resolution electron microscope and micro-diffraction. Strong effect of interface in magnetic behavior of Ni layers is demonstrated and explained by formation of magnetic order in the interface and rough boundaries between layers.

• Periodical: Solid State Phenomena (Volume 215)
• Pages: 259-263
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.215.259
• Online since: April 2014
• Authors: Yuliya E. Greben'kova, Irina S. Edelman, Angelina V. Chernichenko, Dmitry A. Velikanov, Sergey M. Zharkov, Igor A. Turpanov
• Keywords: Exchange Interaction, Interface Structure, Magnetic Property, Magneto - Hard Layer, Magneto - Soft Layer, Ni/Ge Layer Structures

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