The Influence of Growth Duration Process on Morphology and Electrical Properties of SnO₂ Nanostructured Films

Abstract:

Tin oxide (SnO₂) nanostructured thin film with different immersion times was prepared on zinc oxide (ZnO) seeded catalyst using immersion method. The immersion times were varied at 3.0, 3.5 and 4.0 hours. Field emission scanning electron microscopy (FESEM) and two point probes current-voltage (I-V) measurements were used to study the surface morphology and electrical properties of SnO₂ nanostructured thin films. The diameter size of SnO₂ nanostructures which immersed at 3.0, 3.5 and 4.0 h were in range 10-20 nm, 20-30 nm and 30-50 nm, respectively. The results shows the highest electrical properties was at 3.0 h of immersion time.

• Periodical: Solid State Phenomena (Volume 268)
• Pages: 274-278
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.268.274
• Online since: October 2017
• Authors: Ruziana Mohamed*, Khairunisa Md Salleh, Mohd Firdaus Malek, Mohamad Hafiz Mamat, Norihan Yahya, Zuraida Khusaimi, Mohamad Rusop Mahmood
• Keywords: Electrical Properties, Immersion Time, Surface Morphology Properties, TiN Oxide

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