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Investigations on Surface and Bulk Semiconductor Properties Using Wavelength Dependent TRMC Measurements
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HomeSolid State PhenomenaSolid State Phenomena Vols. 32-33The Influence of the Electron Subsystem Excitation...

The Influence of the Electron Subsystem Excitation on the Kinetics and Dynamics of Dislocations

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Gettering and Defect Engineering in Semiconductor Technology V

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Periodical:

Solid State Phenomena (Volumes 32-33)

Pages:

619-0

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.32-33.619

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Online since:

December 1993

Authors:

V.A. Makara, L.P. Steblenko, E.G. Robur

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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