Thin Films of Granular Silicon: Electrical, Structural and Optical Characterization

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Periodical:

Solid State Phenomena (Volume 54)

Edited by:

Aldo Ferrari

Pages:

109-118

DOI:

10.4028/www.scientific.net/SSP.54.109

Citation:

C. Ciofi et al., "Thin Films of Granular Silicon: Electrical, Structural and Optical Characterization", Solid State Phenomena, Vol. 54, pp. 109-118, 1997

Online since:

August 1997

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$35.00

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