Optical and Morphological Properties of Stain-Etched Porous Silicon Films for Anti-Reflection Coatings of Photovoltaic Devices

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Periodical:

Solid State Phenomena (Volume 54)

Edited by:

Aldo Ferrari

Pages:

59-64

DOI:

10.4028/www.scientific.net/SSP.54.59

Citation:

L. Schirone et al., "Optical and Morphological Properties of Stain-Etched Porous Silicon Films for Anti-Reflection Coatings of Photovoltaic Devices", Solid State Phenomena, Vol. 54, pp. 59-64, 1997

Online since:

August 1997

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$35.00

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