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HomeSolid State PhenomenaSolid State Phenomena Vol. 54Optical and Morphological Properties of...

Optical and Morphological Properties of Stain-Etched Porous Silicon Films for Anti-Reflection Coatings of Photovoltaic Devices

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Light Emission from Silicon

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Periodical:

Solid State Phenomena (Volume 54)

Pages:

59-64

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.54.59

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Online since:

August 1997

Authors:

L. Schirone, G. Sotgiu, Andrea Parisini, M. Montecchi

Keywords:

Coating, High Resolution Electron Microscopy (HREM), Porous Silicon (PS), Reflectance Spectroscopy, Solar Cell, Stain-Etch

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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