Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current

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Periodical:

Solid State Phenomena (Volumes 67-68)

Edited by:

J.H. Werner, H.P. Strunk, H.W. Schock

Pages:

57-68

DOI:

10.4028/www.scientific.net/SSP.67-68.57

Citation:

R. Scheer "Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current", Solid State Phenomena, Vols. 67-68, pp. 57-68, 1999

Online since:

April 1999

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$35.00

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