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HomeSolid State PhenomenaSolid State Phenomena Vols. 67-68Qualitative and Quantitative Analysis of Thin Film...

Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current

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Polycrystalline Semiconductors V

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Periodical:

Solid State Phenomena (Volumes 67-68)

Pages:

57-68

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.67-68.57

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Online since:

April 1999

Authors:

R. Scheer

Keywords:

Diffusion Length, Electron Beam Induced Current (EBIC), Grain Boundary, Solar Cell, Thin Film

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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