From Point to Extended Defects in Silicon: A Theoretical Study

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Periodical:

Solid State Phenomena (Volumes 85-86)

Edited by:

S. Pizzini

Pages:

177-202

DOI:

10.4028/www.scientific.net/SSP.85-86.177

Citation:

P. Alippi et al., "From Point to Extended Defects in Silicon: A Theoretical Study", Solid State Phenomena, Vols. 85-86, pp. 177-202, 2002

Online since:

December 2001

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$35.00

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