Studies of Amorphous Ni-P Thin Films Produced by the Chemical Reduction Method

K. Konopka; M. Trzaska; Dariusz Oleszak; W. Zieliński; Krzysztof Jan Kurzydlowski

doi:10.4028/www.scientific.net/SSP.94.249

Paper Titles

Novel Method for Diagnostic the Structural Transformations in Nanostructured Metals
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Utilisation of XRD for the Determination of the Size Distribution of Nanocrystalline Iron Materials
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Study of Grain Size Distribution in Nanocrystalline Iron Oxides Synthesized by Hydrothermal Method
p.239

The Structural and Tribological Properties of Nanocrystalline Electrochemical Coatings with Nickel Matrix
p.245

Studies of Amorphous Ni-P Thin Films Produced by the Chemical Reduction Method
p.249

Structure Changes Caused by the Stress Gradient in Subsurface Layers of Germanium Single Crystals
p.253

Microwave Response of La_2/3Ca_1/3MnO₃ Thin Films
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The Influence of the Pretreatment of Si Substrate on the Growth of PbS Thin Films in the SILAR Technique
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The Polymeric Layers Formation by Sorption from Organic Solutions
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Studies of Amorphous Ni-P Thin Films Produced by the Chemical Reduction Method

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Solid State Phenomena (Volume 94)

Pages:

249-252

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.94.249

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Online since:

June 2003

Authors:

K. Konopka, M. Trzaska, Dariusz Oleszak, W. Zieliński, Krzysztof Jan Kurzydlowski

Keywords:

Amorphous Material, Crystallization, Microstructure, Ni–P Alloy

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References

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