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Online since: October 2011
Authors: Wei Ping Du, Shao Hong Wei, Mei Hua Zhou
Pure ZnO diffraction peaks match well with those given by the JCPDS card No.36-1451 for the hexagonal wurtzite structure.
The SnO2-ZnO nanofibers are in the polycrystalline structure with two phases of tetragonal rutile SnO2 (JCPDS 41-1445) and hexagonal wurtzite ZnO (JCPDS 36-1451) structure.
In particular, the charge transfer contributes to the enhancement of surface reactions which are proportional to the number of available electrons.
Acknowledgement This work was supported by Shanghai Leading Academic Discipline Project, (Project Number: B604), Foundation of He’nan Educational Committee (No. 2009A150001), Foundation of He’nan Science and Technology Committee (No. 092102210404).
Online since: September 2014
Authors: P.T.A. Santos, P.T.A. Santos, F.N. Silva, A.C.F.M. Costa, P.M.A.G. Araújo, E.M. Araújo
Is identified the characteristic peaks of chitosan, according to the JCPDS 40-1518 crystallographic standard and peaks characteristic of the spinel normal ZnAl2O4 according to the JCPDS 05-0669.
The peaks visas approximately between 15° and 30° of Fig. 1, which matches the chitosan of according to the card JCPDS 40-1518 occurred due the lack of ordination crystalline the long distances interatomic which generates a random structure of amorphous form.
Such fact occurred in virtue Qs/NPLs of ratio where the surface roughness has occurred according to the agglomerates size of ZnAl1.9Eu0.05O4 NPLs presenting, encapsulation of NPLs minor in matrix chitosan with greater number of particle/agglomerate in the film surface.
The peaks of symmetric and asymmetric vibrations arising around 1058-1028 cm-1 displaced to a wave minor number are characteristics of the siloxane groups (Si-O-) and C-O, which form the inorganic skeleton.
Online since: April 2016
Authors: Ying Shi, Jian Jun Xie, Ling Cong Fan, Yu Yu Zhang, Xiao Xin Zhang, Xu Chen, De Bao Lin
When the sintering temperature was 1000 ℃, the average grain size of the crystal particles was 100-200 nm and the thickness of the thin film was about 380 nm when the coating layer number up to 10.
When the thin films were calcined under 1000 ℃, diffraction peaks of A-type LSO indexed to the JCPDS card No. 52-1187 appeared obviously.
With the calcination temperature raising up to 1100 ℃, the phase had changed from A-type LSO to B-type LSO (JCPDS card No. 41-0239).
Analysis with the coordination number of A-type LSO and B-type LSO from Table 1, the reason why the thin film became much more thinner under 1100 ℃ was that the coordination number of B-type LSO became lower and the reengineering of the organization structure[9].
The thin film was of average grain size of 100-200 nm at 1000 ℃, besides, the thickness was of about 380 nm when the coating layer number up to 10.
Online since: March 2023
Authors: Baghdadi Chouial, Kenza Kamli, Zakaria Hadef, Beddiaf Zaidi, Salim Boulkhessaim
SnS2 can exist in a number of polytypes [9].
The SnS2 crystal structure improves at Ts ≥ 300 ° C, and the films exhibit a preferred orientation (001) located at 2θ ≈ 15° according to the diffraction profiles (JCPDS Card No. 23-0677), which corresponds to a hexagonal crystallographic phase.
This finding is in agreement with the results reported in the literature [27, 28]. whereas the diffraction peak at 26.20° corresponding to the (120) plane of the SnS orthorhombic structure (JCPDS Card No. 33-1375) was observed for Ts = 300 °C.
Moreover, the spectrum of the film produced at Ts = 350 °C shows that the SnS phase has almost vanished and the SnS2 phase is present with the (001), (111), (101), and (110) orientations planes according to the JCPDS data card 23-0677 of the SnS2 hexagonal crystal structure.
The number and diameter of bumps decrease when the substrate temperature increases.
Online since: October 2010
Authors: Chun Rong Wang, Zhu Fa Zhou, Yan Jie Li, Ran Ran Tian, Xiao Chun Dai
Diffraction peaks of crystalline phases were compared with those of standard compounds reported in the JCPDS Data File.
The diffraction pattern of the seeds matches well with the standard card α-Fe2O3 reflections (JCPDS No. 33-0664).
And these peaks are well accordant with the standard card Ag reflections (JCPDS No. 65-8424).
Compared to α-Fe2O3 seeds, it is clear that the surface of typical spherical α-Fe2O3 /Ag core/shell structures in Fig. 2 (b) and (c) is not smooth, instead there are some flecks spreading on the surface, indicating that a large number of Ag particles may be included in theα-Fe2O3 nanoparticles.
Online since: May 2014
Authors: Titipun Thongtem, Anukorn Phuruangrat, Somchai Thongtem, Nuengruethai Ekthammathat, Budsabong Kuntalue, Phattharanit Dumrongrojthanath
All diffraction peaks were respectively identified to the (020), (131), (200), (060), (151), (202), (062), (133), (191) and (262) planes of an orthorhombic Bi2MoO6 of the JCPDS card No. 21-0102 [8].
Figure 3 shows SEM images of the as-synthesized 0–3 % Ho doped Bi2MoO6 samples, which were composed of a number of nanoplates with different orientations.
File, JCPDS Internat.
Online since: June 2022
Authors: Yunita Aprilia, Luthfi Mursid Darmawan, Afifah Nur Chairinnisa, Agus Purwanto
The extraction of beverage can waste successfully synthesized into alumina compounds corresponding to JCPDS card No. 29-0063.
XRD Patterns of Ni(OH)2 sample and JCPDS#14-0117 XRD β -Ni(OH)2 Reference Standard [10] Fig. 1 shows XRD patterns of Ni(OH)2 already have the exact peak conformity as JCPDS (Joint Committee on Powder Diffraction Standard) Number 14-0117 to assure the material quality.
In comparison, sample 2 was 36.45 wt%, this was due to a large number of impurities in sample 2, and it can be concluded that the separation of Al metal in sample 2.
According to Lee et al.[16], typical data obtained from the XRD pattern of the LiNiO2 Cathode JCPDS-International Center of Diffraction Data #09-0063 is used for the reference standard.
The XRD patterns of all samples were similar and well-indexed to JCPDS #09-0063 standard.
Online since: June 2010
Authors: Min Xu, Xi Hua Zhao
But if the reaction time is too short, crystal structure is unstable and intermediate products obtained as a jelly which are difficultly filtered and format hard bulk solids as it had dried and be difficult to re-open, and in the middle of that would be mixed with a large number of inorganic salts solution.
By comparing the JCPDS powder diffraction card, the diffraction peak and the standard spectrum (JCPDS 48-1548) line of monoclinic CuO is uniform, which indicated that the target product was synthesized, and the peak type is sharp, intensity diffraction is high, which indicated it a good crystalline products.
Online since: June 2014
Authors: Ana Cristina Figueiredo de Melo Costa, Kaline M.S. Viana, Patrícia Tatiana Araújo Santos, Tatiana C.P. França, Bruno B. Dantas
Introduction Diabetes mellitus (DM) is one of the most serious health problems today, due to the large number of affected people, disabilities, premature mortality, and high costs of governments due to prolonged hospitalization, early retirements and spending on medications and supplies .
It is observed that the hybrid is composed of 84% of the major phase of magnetite (Fe3O4), identified by the crystallographic plug JCPDS 88-0315, and traces of hematite (Fe2O3) in 16%.
Fig. 2 - X-ray diffractorgrams: (a) XRD pattern of the hybrid Fe3O4/APTES and (b) XRD pattern of JCPDS card 88-0315 of the magnetite and JCPDS 88-0315 da magnetite.
Online since: March 2022
Authors: Joel Díaz-Reyes, Oscar Secundino-Sánchez, José F. Sánchez-Ramírez, José S. Arias-Cerón, Miguel Galván-Arellano, Ángel Guillen-Cervantes
Introduction The synthesis of new semiconductor materials in nanometric size has received much attention in recent years because of the industrial demands increase [1], the number of reports on these nanoparticles such as nanofibers (NF’s) has increased worldwide mainly on titanium dioxide [2].
However, it is not the only one; a greater number of their physical properties can be exploited by carrying out a more detailed and systematic characterization of the morphological and structural properties.
In Fig. 5a diffractogram of the M5 sample shows diffraction peaks at 2q = 25.24, 37.69, 48.02, 53.84, 54.23 and 62.70°, which correspond to the crystalline planes (101), (004), (200), (105), (211) and (204), respectively, of anatase CP (JCPDS cards # 00-021-1272).
The diffractogram of the M10 sample (Fig. 5d) exhibits main diffraction peaks at 2q = 27.37, 36.00, 54.40 and 56.55° that are associated to the crystalline planes (110), (101), (211) and (220) of rutile CP (JCPDS cards # 00-021-1276).
The peaks are labelled using standard crystallographic cards (JCPDS cards # 00-021-1272) for anatase, and (JCPDS cards # 00-021-1276) for rutile.