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Using conventional OIM capabilities, Sun et al. [13] made the first measurements of Nye's dislocation density tensor - in an Al bicrystal.
The resolution of the conventional EBSD techniques, based upon the Hough transformation for indexing lattice orientation, has been addressed by El-Dasher et al. [14], and Field [15], and more recently by Kacher and Adams [16].
Of particular interest here, however,are the high-resolution cross-correlation-based techniques pioneered by Troost and coworkers in 1993 [17], and more completely developed by Wilkinson et al. in 2006 [18].
An augmentation of Wilkinson's approach, named the simulated-pattern method (SPM), was introduced by Kacher et al. in 2009 [19].
El-Dasher, B.L.

Elsharkawy and El-Domiaty (2001) introduced a mathematical model for stretch-bending of T-section beams [1].
Liu et al. (2010) proposed a model of complex cross-section parts to predict springback [3].
El-Domiaty, Determination of stretch-bendability limits and springback for T-section beams, J.
Wu, et al, Springback analysis of Z & T-section 2196-T8511 and 2099-T83 Al–Li alloys extrusions in displacement controlled cold stretch bending, J.
Alves, et al, Prediction of wrinkling and springback in sheet metal forming.

There are also some studies on the formation of amorphous phase in binary systems such as Al-Ti [8] and Ti-Ni [9,10].
After 1 h, particles of Ti, Al and Ni can still be distinguished with irregular shapes.
No other peaks corresponding to Ti, Al, Ni or intermetallic compounds are observed.
Góral, Enthalpy of formation of intermetallic phases from Al-Ni and Al-Ni-Ti systems, Intermetallics. 42 (2013) 92-98, 10.1016/j.intermet.2013.05.016 [4] F.
El-Eskandarany, Amorphous-i phase-big cube-amorphous cyclic phase transformation of mechanically alloyed Zr75Ni20Al5 system, Intermetallics. 63 (2015) 27-36, 10.1016/j.intermet.2015.01.010 [13] Y.

U.S.T.H.B, BP 32 El Alia.
El-Sheikh, A.P.
Tan, A.L.
Hameed, A.L.
Al-Asheh, L.

Other ceramic reinforcing material such as Si3N4 has also been studied by Ramli et al. [4] and Mohd Salleh et al. [5].
This statement supported by Tsao et al [14].
The addition Ni nanoparticles also influence the thickness and shape of IMC layer as reported by Tay et al.[16].
El-Daly, W.M.
El-Shaarawy, and A.M.

KADRI1,b 1LMESM, Oran University of Science and Technology - Mohamed Boudiaf, El Mnaouar, BP 1505 Bir El Djir, Oran, Algeria. 2MEMS & Sensors, Division Microélectronique et Nanotechnologie, Centre de Développement des Technologies Avancées (CDTA), BP 17 Baba Hassen, Algiers, Algeria.
Matsuo et al [25] mentioned the relationship existing between the XRD and the stoichiometry of PZT.
;et al.
;Jung-Hyun, P. ; Jyoti, A. ; et al.
[18] Lee, SH.; Ryu, MK.; Kim, JP. et al.

Banerjee, et al: Catena.
El-Naas: J.
Xenos, et al: J.
Gustafsson, et al: J.
Agrawal, et al: J.

Similar observations were also made by El-Eskandarany [30] in nanocrystalline TiC milled powders.
El-Sherik, G.
El-Eskandarany, K.
El-Eskandarany, K.
El-Eskandarany: J.

During the landscape design of the waterfront district, the designers often lack of full attention to the water environment problems and lack of system theory knowledge, so that some water environment problems (poor hydrodynamic, deteriorated water quality et al) will be emerged during long term operation of water landscape.
References [1] Abdallah Shanableh, Maher Omar, Abdul-Aziz Al-midfa: “Baseline assessment of water quality and circulation patterns in the Khalid and AL-Khan adjacent coastal lagoons in Sharjah”, UAE-Proceedings of The Thirteenth International Offshore and Polar Engineering Conference.
El Sayed, in: Ecological Engineering, Vol. 27, (2006), p. 1-12 [3] Xiaobing Zhu, Shu Gao, Miaohong Chen et al, in: Journal of tropical oceanography, Vol. 22(3) (2003), p.71-77(In Chinese) [4] Fuxun Ni, Siyu Zeng, Tianzhu Zhang, in: Si Chuang Environment, Vol. 25(4) (2006), p.82-86, (In Chinese) [5] Fengxin Wang: Study on theory and application of planning of land reclamation coupled with water circulation system, (Tianjin University, Tianjin, 2009) (In Chinese)

Entel et al.: Mater.
Sutou et al.: Appl.
Khan et al.: Appl.
Khan et al.: J.
Stuhr et al.: Phys.