EBSD-Based Dislocation Microscopy

Abstract:

Recent advances in high-resolution electron backscatter diffraction (EBSD)-based microscopy are applied to the characterization of incompatibility structures near the grain boundaries (GBs) in polycrystals. The principal interest described here is recovery of geometrically-necessary dislocation (density) tensors, of the 2- and 3-D type, described by Nye and Kröner. These developments are presented in the context of the continuum dislocation theory. High resolution data obtained near a single grain boundary in well-annealed, low content steel suggests that it may be possible to measure the intrinsic elastic properties of GBs.

• Periodical: Solid State Phenomena (Volume 160)
• Pages: 3-10
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.160.3
• Online since: February 2010
• Authors: Brent L. Adams, Calvin J. Gardner, David T. Fullwood
• Keywords: Dislocation Tensor, Electron Backscatter Diffraction (EBSD), Electron Microscopy, Strain Localization

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