EBSD-Based Dislocation Microscopy

Abstract:

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Recent advances in high-resolution electron backscatter diffraction (EBSD)-based microscopy are applied to the characterization of incompatibility structures near the grain boundaries (GBs) in polycrystals. The principal interest described here is recovery of geometrically-necessary dislocation (density) tensors, of the 2- and 3-D type, described by Nye and Kröner. These developments are presented in the context of the continuum dislocation theory. High resolution data obtained near a single grain boundary in well-annealed, low content steel suggests that it may be possible to measure the intrinsic elastic properties of GBs.

Info:

Periodical:

Solid State Phenomena (Volume 160)

Edited by:

H. Klein and R.A. Schwarzer

Pages:

3-10

DOI:

10.4028/www.scientific.net/SSP.160.3

Citation:

B. L. Adams et al., "EBSD-Based Dislocation Microscopy", Solid State Phenomena, Vol. 160, pp. 3-10, 2010

Online since:

February 2010

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Price:

$35.00

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