Committees
Foreword
EBSD-Based Dislocation Microscopy
p.3
p.3
Calculation Methods to Determine Crystallographic Elements: Interface Plane, Surfaces Plane and Twinning Elements, Based on Electron Diffraction Orientation Measurements by SEM and TEM
p.11
p.11
Two- and Three-Dimensional EBSD Measurement of Dislocation Density in Deformed Structures
p.17
p.17
Texture Control in Non-Oriented Electrical Steels by Severe Plastic Deformation
p.23
p.23
Texture versus Residual Deformation Effects in Metal Materials: Principles of Experimental Approach and General Regularities
p.31
p.31
Application of Electron Backscatter Diffraction to Grain Boundaries
p.39
p.39
Texture Heterogeneity in ECAP Deformed Copper
p.47
p.47
Committees
Abstract:
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Info:
Periodical:
Solid State Phenomena (Volume 160)
Online since:
February 2010
Сopyright:
© 2010 Trans Tech Publications Ltd. All Rights Reserved
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