Search results

Large numbers of works have illustrated that microwave absorption properties of absorbing materials often depend strongly on their morphologies [6-9].
Form Fig. 1, it can be clearly found that all the reflection peaks of S1 and S2 can be perfectly indexed as face-centered cubic (FCC) Ni (PDF standard cards, JCPDS 04-0850, space group Fmm).

Meanwhile, The XRD patterns also show that the crystal structure of the as-synthesized nanoparticles is face-center spinel and the presence of the diffraction peaks are corresponding to the (220), (311), (222), (400), (422), (511) and (440) planes, which is consistent with the standard JCPDS card of zinc ferrite.
a b c Fig. 2 TEM micrographs of the zinc ferrite using different amounts of Non-ionic surfactant a TEM of the zinc ferrite without Non-ionic surfactant addition b TEM of the zinc ferrite with 0.5g Non-ionic surfactant addition c TEM of the zinc ferrite with 0.8g Non-ionic surfactant addition a b c Fig. 3 SEM micrographs of the zinc ferrite using different amounts of Non-ionic surfactant a SEM of the zinc ferrite without Non-ionic surfactant addition b SEM of the zinc ferrite with 0.5g Non-ionic surfactant addition c SEM of the zinc ferrite with 0.8g Non-ionic surfactant addition Fig. 4 shows that the FT-IR absorption spectrum of ZnFe2O4 nanoparticles in the wave-number range between 400 and 4000cm-1.The vibrational spectra of the absorption bands of pure spinel zinc ferrite nanoparticles were observed at 450cm-1 and 547cm-1 for the samples calcined at 500℃.

When the number of HA granules is increased, the biological affinity of the composites may increase.
Vol.28 (2002), p.181-188 [10] JCPDS card: No. 9-432 [11] A.

However, the rapid development of China's high temperature industries causes more and more silica bricks out of use, and a large number of used silica bricks were produced every year [1].
We can see from the figure, the strong and sharp peaks with 2θ values at 35.7°, 41.5°and 60.0° are in good agreement with the standard value for β-SiC (JCPDS Card No. 73-1665).

All the patterns are consistent with the JCPDS card (50-0954).
Here, the kL can be calculated by kL = k - ke = k- LsT, where ke is the electronic thermal conductivity, L is the Lorenz number, about 1.5 × 10-8 V2 K-2 in non-degenerate semiconductors with acoustic scattering.[12] At low temperatures (<350K), the samples with ZnAlO have obtained lower k compared with that of BiTeSe.

Up till now, a number of physical and chemical techniques such as the vapour liquid solid method [8], chemical vapour deposition [9], hydrothermal growth [10-13] and chemical bath deposition [15-17] were used to fabricate well-aligned ZNRAs or ZNWAs.
It can be noted that all of the diffraction peaks of ZnO nanorods can be indexed as those from the known wurtzite-structured (hexagonal) ZnO (JCPDS card No. 36-1451), the (002) diffraction peak of ZnO.nanorods displays a substantially greater intensity, further confirming that ZnO nanorods are much better aligned on a ZnO seeds-coated p-Si substrate and also that nanorods grow along (0001) direction.

The existence of multiple diffraction peaks of (100), (002), (102), (110), (103),(200),(112) and (201) in the diffraction patterns suggests that the ZnO samples have a typical Hexagonal structure referring to JCPDS card no. 36-1451 data[7].
It is believed that as the particle size increases, the number of atoms that form a particle also get increasing which consequently render the valence and conduction electrons more attractive to the ions core of the particles, and hence decreasing the band gap of the particles.

In the presence of catalyst, H2O2 can produce a large number of free radicals, improve the ability of oxidation at the same time, improve the efficiency of wastewater treatment, and won't produce sludge, solve the problems of Fenton oxidation.
Fig.1 ZnO XRD at 500 ˚C Fig.2 ZnO TEM at 500 ˚C As showed in Fig.1, the diffraction peak position and intensity of ZnO was same with JCPDS (No.36-1451) card of pure ZnO, six hexagonal wurtzite structure, and no other peaks of impurities, showed that the purity of ZnO was high.

A large number of beautiful BaTiO3 homogeneous structures were uniformly formed, covering the substrate.
The diffraction peaks can be indexed to well-crystallized tetragonal structures of BaTiO3, corresponding to the JCPDS Card No 05-0626.

Crystal Growth 47, 230 (1979) [11] Joint Committiee on Powder Diffraction Standards (JCPDS) Card number 38-1435 [12] A.I.