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All the samples are the cubic-phase pattern, which are in a good agreement with JCPDS Card No. 41-110.
In the UC processes, UC PL intensity changes as the excitation power changes, which complies with the following relation: (1) where n is the number of laser photons which are required on the UC processes.
The number of Tm3+ ions in 3H5 state reduces.

Hereafter in the current text these samples, except the ones of 37% m/V Pluronic F127, are referred as HA-FILT (filtered samples), HA-CALC (Calcined samples) and HA-PL (lyophilized composite with 10% of Pluronic F127), in which an additional final code (number) indicates the temperature of synthesis.
[12] JCPDS Information Center for Diffraction Data, card numbers: 09-0169 and 09-0432, 1997

Then, the diffraction data were compared with the standard JCPDS card to identify the types of the precipitates.  
It is worth noting that when the aging time was 500h, the holes appeared on the grain boundaries, and the holes numbers increased with the aging time.
The number corresponding to the diffraction peak is the d value of the phase.

Williamson and Smallman suggested one method to calculate the dislocation density as [14]         〉〈 = bP eFnK 2/122/1 )/3( ρ (2) where P is the crystallite size, 1/2 the R.M.S strain, b the Burgers vector, n the number of dislocations on each face of the particle, K the constant depending on the strain distribution and F is an interaction parameter.
When the bath temperature increases, large number of Cd and Se ions gets adsorbed on the substrate which leads to crystallization.
JCPDS Diffraction Data Card.No.08-0459

As a result, a few thin layers of these compounds are formed at first, and their number increases gradually with time [7, 8, 43].
This measurement was then compared with the data provided by the JCPDS card no. 03-0931, which corroborated the findings reported in references [46, 47].
This measurement agreed with the data provided by the JCPDS card no. 01-1174, and was also compatible with prior findings [49].

It is clear that all of the peaks in Fig. 4 matched with the standard JCPDS cards of ZnO (JCPDS 79-2205) with a wurtzite hexagonal structure.
However, the number of nanoflakes in S2b was higher than S2a.
Increasing the particles number will work on reducing the interfacial tension more due to Brownian motion [22, 23].

All peaks of this XRD pattern can be indexed as those of standard wurtzite (hexagonal) ZnO, consistent with the standard ZnO powder values from the JCPDS card (65-3411) with space group P63mc.
Acknowledgements This work was financially supported by the National Natural Science Foundation of China under grant number 50774014, and the project of “863 Plan of China” under grant number 2008AA03Z514.

One advantage of nanoparticles is their capacity to stop material degradation.The features of the nanoparticles, which are summed up in their tiny size and vast surface area, are leading to an increase in the number of surface atoms that are enhanced, as well as physical-mechanical and physical-chemical resistance [13].
Parameters Type and/or size Material Target Substrate Al2O3 nanoparticles 316,304 stainless steel Laser parameter Wavelength[nm] Repetition rate[Hz] Energy[mJ] Pulse number[shot] Pulse width[ns] 1064 3 1000 500 10 Pressure parameter Base pressure [mbar] 10-2 Target Parameter Diameter[cm] Thickness[cm] 2 0.5 Substrate Parameter Area [cm2 ] Thickness [cm] Temperature[C] 3.14 0.5 200° Distance between contact (L) [cm] 12 Corrosion test A Digi-ivy, Inc. potentiostat/galvanostat (DY2323) that was operated by a computer was used to take the voltammetric measurements seen in Figure (3) The corrosion test was carried out according to the polarization method in the Laboratory of Corrosion /Materials Engineering Department / University of Technology.
The XRD spectra show a typical hexagonal wurtzite structure of Al2O3 concerning standard card (JCPDS No. 79-0208), where the matching with the firm diffraction peaks (2ϴ ~ 68.19, 43.8, 37.7 ), are observed corresponding to (300), (113), and (110)planes, respectively.

The (1 0 0), (0 0 2), (1 0 1), (1 0 2), (1 1 0), (1 0 3) and (1 1 2) peaks appeared for sample A are the characteristic peaks of ZnO hexagonal wurtzite structure (JCPDS File Card No. 36145).
As respects, there was the same amount of precursors in two solution synthesis methods, growing up sample B until 30 min denotes the formation of low number of nucleuses in initiation of process and aggregation of crystallites carried out during the growth time.
While for sample B, synthesis under ultrasonic waves cause the production of more number of nucleuses and growth stage is followed by Ostwald ripening process.

The observed diffraction peaks matched the characteristic peaks for the crystal structure of anatase coincide with the JCPDS Card No: 01-078-2486.
Acknowledgement The author would like to acknowledge the support from the Fundamental Research Grant Scheme (FRGS) under a grant number of FRGS/1/2017/TK07/UNIMAP/02/6 from the Ministry of Education Malaysia and Tin Solder Technology Research Grant (TSTRG) under grant number of 9002-00082 from Tin Industry (Research and Development) Board.