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For their unique structure of high aspect ratio and large number of dangling bonds, CNTs have strong microwave absorbing performace in the GHz frequency range [8].
Results and discussion Figure 1 shows the XRD patterns of 1wt%CNTs/Ni0.5Zn0.45Co0.05Fe2O4 composites hydrothermally treated at 200 °C for 3h (Fig.1. a), and bulks fabricated by SPS at 750oC for 5 min (Fig.1. b).For the hydrothermal treated sample in Fig.1. a, all the typical diffraction peaks are well agreement with the standard JCPDS card NO.8-234.

The intensity of this diffraction peak is based on the number and distribution of the corresponding atoms in the crystal.
The peaks present in the obtained XRD patterns are well-matched with JCPDS card no. 89-1012 (ZnFe2O4) and 22-1086 (CoFe2O4).

All the diffraction peaks in XRD can be indexed to pure hexagonal CdS with lattice constants of a =b = 4.147 Å and c = 6.747 Å, which are consistent with the data in the standard card (JCPDS 75-1545).
It has been observed that the nature of the emitting states change as the cluster size decreases, and the luminescence intensity band gap and the number of surface states increases [18].

Recently, a big number of biological, chemical, physical, and hybrid approaches exist for synthesizing nanoparticles in various kinds.
The resultant peaks were matched with card JCPDS (No. 87-0720).

Compared to the JCPDS standard card (No. 21-1250) of SnO2, the peak positions agree well with cassiterite SnO2, no other phases have been detected, indicating that all antimony ions come into the crystal lattice of SnO2 to substitute for tin ions.
Because of the slow heating rate and uneven heating, the dehydration isn’t enough, so there may still have a large number of free water molecules on the precursor, forming the agglomeration between the nanoparticles.

There have been a number of research works on nickel electroplating that have reported the successful preparation of composite coatings via direct current, pulsed current or reversed pulse current [19].
The analysis of the XRD patterns prepared with electrodeposition method shows that the majority of the diffraction lines can be ascribed to Ni from ASTM card.
[20] Power Diffraction File Alphabetical Index, JCPDS-ICDD International Center for Diffraction Data, Swarthmore, USA, 1988, File 21-1272 for anatase, File 21-1276 for rutile

These diffraction peaks could be indexed to a hexagonal wurtzite structure (JCPDS Card No.36-1451) with lattice constant a = 0.3249 nm and c = 0.5205 nm.
Thus, the poor photodegradation efficiency was attributed to the limited number of trapped holes and electrons as most of the photogenerated electrons and holes were recombined and produced green emission.

After the calcination of (Sr0.95Nd0.05)2TiO4 precursor powder at 900 °C, the main diffraction peaks correspond to that of standard JCPDS Card (No. 39-1471) of Sr2TiO4 phase, whereas a small a mount of Nd2O3 and SrCO3 phases were observed.
All the κe values can be calculated by using the Wiedemann-Franz law expressed by κe=L0T/ρ, where L0 is the Lorentz number (here L0 = 2.443×10-8 WΩK-2 for free electron is adopted for the estimation).

All reflection lines are indexed in agreement with the JCPDS card No. 43-0507; and it shows that YIG sample is free of secondary phases, indicating that the microwave absorption is due only to the YIG phase.
Additional peaks on main FMR mode are also observed, see inset of Fig. 5, where the shape and the number of these peaks depend on the temperature of the sample.

X-Ray Diffraction: Figure (1) depicts the X-ray diffraction patterns of CuxCe0.3-XNi0.7Fe2O4 ferrite nanoparticles samples, which were compared to the diffraction patterns in JCPDS Standard Card No. 10-0325 for NiFe2O4.
When the H2S gas is withdrawn, no more free electrons are generated, and the sensor is "washed" of H2S gas, reducing both the number of free electrons and the electrical current signal.