Books by Keyword: Defect Reduction

Description: By integrating technological features of crystal and epitaxial layer growth, physics of defect occurrence processes and procedures for eliminating their effects, and device engineering, this edition provides a comprehensive overview of the current state of research and existing approaches to mitigating defect-related limitations in SiC-based technologies.

Description: The 36th volume of the journal "Advanced Engineering Forum" contains peer-reviewed manuscripts depicting the engineering solutions and research results dealing with contemporary problems in applied materials science, mechanical engineering, building engineering, applied mechanics, power engineering and engineering management. The published research papers can attract professionals in various branches of engineering, students as well as scientific investigators workings in the related fields.