Engineering Research
Materials Science
Engineering Series
Books by Keyword: Edge Detection
Books
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 241 papers are grouped as follows:
Chapter 1: Development and Processing of Innovative Materials;
Chapter 2: Electronic and Semiconductor Devices;
Chapter 3: Power Systems and Applied Electronics;
Chapter 4: Measurement and Monitoring of Systems;
Chapter 5: Modelling, Simulation and Optimization;
Chapter 6: Analysis and Design of Structures and Machines;
Chapter 7: Data and Signal Processing;
Chapter 8: Neural Network and Applied Algorithms;
Chapter 9: Control Systems;
Chapter 10: Communication Systems, Network and Information Technologies;
Chapter 11: Technologies in Manufacture and Engineering Management.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 112 papers are grouped as follows:
Chapter 1: Metals and Alloys;
Chapter 2: Applied Materials in Industry;
Chapter 3: Energy Science and Engineering;
Chapter 4: Manufacturing Science and Engineering;
Chapter 5: Microelectronics and Embedded Systems;
Chapter 6: Mechatronics;
Chapter 7: Automation and Robots;
Chapter 8: Information Technology and Data Processing;
Chapter 9: CAD/CAM/CIM;
Chapter 10: Other Topics
Selected, peer reviewed papers from the 2012
International Conference on Spacecraft Structures, Materials and Mechanical
Testing (ICSSMMT 2012), December 27-28, 2012, Xiamen, China.
The papers are grouped as follows:
Chapter 1: Material Engineering and Technology;
Chapter 2: Spacecraft Structures Technology;
Chapter 3: Advanced Achievements of Mechanical Engineering and Manufacturing
Technology;
Chapter 4: Advanced Applications of Electrical Engineering Development
Volume is indexed by Thomson Reuters CPCI-S (WoS).
These selected papers reflect the interdisciplinary nature of the conference and the diversity of topics is an important feature of this conference, enabling an overall perception of several important scientific and technological trends.
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
The aim of this special volume is to facilitate the exchange of information on best practice for Photonics Materials and Devices, Optical Materials and Devices, NEMS/MEMS Materials and Devices, Electronic Materials and Instruments, Modeling, Simulation and Applications, etc. It will provide an opportunity for engineers and scientists in academia, industry and government to address the most innovative research and development ideas, together with their technical challenges, social and economic issues, and to discuss the ideas, results, work-in-progress and experience in all aspects of optical and electronic materials and their applications.