Advanced Measurement and Test

Advanced Measurement and Test

Description:

Volume is indexed by Thomson Reuters CPCI-S (WoS).
This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.

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Info:

Editors:
Riza Esa and Yanwen Wu
THEMA:
TGM
BISAC:
TEC000000
Details:
Selected, peer reviewed paper from 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011) on June 24-26, 2011, Nanchang, China
Pages:
2898
Book Set:
3 Books set
Year:
2011
ISBN-13 (softcover):
9783037851975
ISBN-13 (CD):
9783037950227
ISBN-13 (eBook):
9783038136279
Permissions CCC:
Permissions PLS:
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Review from Ringgold Inc., ProtoView: Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testing techniques, and mechanical and electrical engineering. Many of the Chinese researchers have multiple papers in the proceedings. For example, six papers from a Tianjin Polytechnic team report on the synthesis of PEG2000 lauric acid diester and polyamic acid, the performance of a polysiloxane antifoaming agent, the properties of modified co-polyester fibers, and analysis of a strongly acidic alkyl phosphate. Other topics include a laser measuring instrument for tunnel surfaces, the ERP detection of mental arithmetic strategies, fault diagnosis on telecommunication networks, a photovoltaic supercapacitor and battery hybrid storage system, and a sunlight intensity measurement device.